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Memory devices represent a key component of datacenter total cost of ownership (TCO), and techniques used to reduce errors that occur on these devices increase this cost. Existing approaches to providing reliability for memory devices pessimistically treat all data as equally vulnerable to memory errors. Our key insight is that there exists a diverse(More)
This is a summary of the original paper, entitled " Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory " in DSN-44, 2014 [30]. Recent studies estimate that server cost contributes to as much as 57% of the total cost of ownership (TCO) of a data-center [1]. One key contributor to this high(More)
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