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—This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The(More)
This papers describes a new, fast and economical methodology totest linear analog circuits based on adaptive algorithms. To theauthors knowledge, this is the first time such technique is used totest analog circuits, allowing complete fault coverage. The paperpresents experimental results showing easy detection of soft,large-deviation and hard faults, with(More)