Marcelo Negreiros

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—This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The(More)
This papers describes a new, fast and economical methodology totest linear analog circuits based on adaptive algorithms. To theauthors knowledge, this is the first time such technique is used totest analog circuits, allowing complete fault coverage. The paperpresents experimental results showing easy detection of soft,large-deviation and hard faults, with(More)
A low cost method for testing analog RF signal paths suitable for BIST implementation in a SoC environment is described. The method is based on the use of a simple and low-cost one-bit digitizer that enables the reuse of processor and memory resources available in the SoC, while incurring little analog area overhead. The proposed method also allows a(More)