Marcelo Negreiros

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This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The(More)
This paper presents a method to increase the observability of analog circuits through the use of a statistical sampler. This sampler acquires statistical properties of the input signal. Its main advantages are simplicity, low analog area overhead and suitability to multi-channel acquisition, as only one bit samplers are used. This qualifies it for use in a(More)