Marc Vanden Bossche

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In this paper we present a new measurement solution for the characterization of high frequency devices under large signal operating conditions. It is shown how a device-under-test (DUT) is put under large signal operating conditions and how one then measures the voltage and current waveforms at the signal ports in order to completely and accurately(More)
  • J Verspecht, M Vanden Bossche, F Verbeyst, Jan Verspecht, Marc Vanden Bossche, Frans Verbeyst
  • 1997
A measurement and black-box modeling technique is described enabling the characterization of nonlinear microwave components under periodic large-signal excitation. First, the mathematical model is theoretically described. The model is based on the assumption that the superposition principle holds for the effect of all spectral components, except the(More)
We analyze the input networks of the samplers used in the nose-to-nose calibration method. Our model demonstrates that the required input network conditions are satisfied in this method and shows the interconnection errors are limited to measurement uncertainties of input reflection coefficients and adapter S-parameters utilized during the calibration(More)
— Novel generic frequency domain behavioural models are constructed for mixers and amplifiers. The modelling is based upon three concepts: time-invariant describing functions, linearisation and multidimensional curve fitting. The model parameters can be calculated based upon measured or simulated data. Model performance is illustrated on practical examples.
—It is shown in this paper how the classical concept of the " network analyser " can be extended towards modulated and large-signal operating conditions. The concept is demonstrated by measuring the saturated behaviour of a MMIC amplifier, excited by modulated signals with CDMA characteristics. It is then illustrated how the measured data can be used to(More)
— Using a nonlinear black-box model based on the Volterra theory it is possible to describe the nonlinear behavior of a high frequency amplifier. Acquiring only a strongly reduced set of measurements it is easy to predict the load impedance curves anywhere on a Smith Chart. The classic load-pull approach involves the acquisition of a large amount of data(More)
Today there is a growing importance to deal successfully with devices operating in their non-linear regions. This originates from the use of complex modulation schemes and the demand for high power-efficiency at low cost in modern (portable) telecommunication applications. Presently different measurement techniques are used to characterize the large-signal(More)