Manan Syal

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This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the right-most time frame of the k-frame unrolled circuit, our approach can handle fault injection in any time frame within the unrolled sequential circuit. To efficiently apply our(More)
This paper presents a novel technique to identify functionally untestable transition faults in latch based designs with multiple clock domains, bringing to light unaddressed issues related to untestable fault identification in such design environments. We also introduce and provide a solution to a new variant of un-testability analysis wherein "(More)
This paper presents two novel and low cost techniques that can be used for the purpose of untestable fault identification. First, we present a new theorem and a practical method using static implications to identify unexcitable nets using recurrence relations in sequential circuits. Since each unexcitable net generally infers to more than one untestable(More)
In this paper, we make two major contributions: First, to enhance Boolean learning, we propose a new class of logic implications called extended forward implications. Using a novel concept called implication-frontier, extended forward implications efficiently capture those nontrivial relationships which previous techniques failed to identify. Secondly, we(More)
This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first performed, as a preprocessing step, to identify nets which are uncontrollable to a specific logic value. Then, an implication-based analysis is carried out for each fault to(More)
This paper presents two low-cost fault-independent techniques that can be used to identify significantly more untestable faults than could be identified by earlier fault-independent techniques. A new theorem and an efficient implementation of the theorem for the purpose of identifying sequentially untestable faults are presented first. Unlike the(More)
In this paper, we propose novel low-cost methods that combine <i>static</i> logic implications and binary resolution to significantly increase the number of non-trivial signal relations learned from the circuit. The proposed method first applies resolution techniques to learn new static single-node implications and then uses them to learn powerful(More)