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This paper describes the backside defect searching by means of the low frequency ∞ coil excitation. The low frequency ∞ coil excitation confronts to a noise processing problem in the practical tests.… (More)
This paper describes a liftoff characteristic on backside defect searching by low frequency excitation of the � coil. The low frequency � coil excitation confronts to a noise problem in the practical… (More)