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We present an application of Defect Oriented Testing (DOT<sup>1</sup>) to an industrial mixed signal device to reduce test time and maintain quality. The device is an automotive IC product with stringent quality requirements and a mature test program that is already in volume production. A complete flow is presented including defect extraction, defect(More)
Most analyses of circuit equations start with solving the steady-state (DC) solution. In several cases this can be very hard. We present a novel time domain source stepping procedure to obtain a DC solution of circuit equations. The source stepping procedure is automatically adap-tive. Controlled sources can be elegantly dealt with. The method can easily be(More)
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