Maike Taddiken

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Analog circuit performance are degrading by effects like HCI and NBTI. These performance shifts need to be evaluated by the designer to meet given specifications. The evaluation on transistor level enables an accurate prediction of degradation behavior for a chosen circuit. However, this task is very time-consuming for complex analog circuitry. This paper(More)
An analog system's performance can be influenced by many factors such as age-dependent degradation effects which need to be considered during the design process. Transistor level degradation analysis is very time-consuming for large and complex circuits. Behavioral models can be used to speed up the simulation and enable an evaluation on a higher(More)
Ring oscillators exhibit a strong temperature dependency. Additionally, degradation in CMOS transistors affects the performance of circuits over time and is strongly dependent on temperature during circuit operation. In order to design robust and reliable ring oscillator-based circuits, both temperature dependencies have to be considered. This work(More)
In this paper a comprehensive analysis of 12 different extraction methods for the threshold voltage V<inf>th</inf> is presented. Accounting for the emerging needs of advanced technology nodes the methods are evaluated with TCAD simulations of FDSOI, Bulk and Fin MOSFET devices. The presented analysis provides Figures of Merit in order to choose the most(More)
In this paper a Reliability-AwaRE (RARE) method based on the gm/ID-methodology is presented which allows designers of integrated analog circuits to consider process as well as environmental variations and aging effects already at early design stages. The proposed method makes aging simulations on system level superfluous by utilizing a stochastic Look-Up(More)
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