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STT-RAM technology has recently emerged as one of the most promising memory technologies. However, its major problems, limited write endurance and high write energy, are still preventing it from being used as a drop-in replacement of SRAM cache. In this paper, we propose a novel coding scheme for STT-RAM last level cache based on the concept of value(More)
The continuous decrease in CMOS technology feature size increases the susceptibility of such circuits to single event upsets (SEU) caused by the impact of particle strikes on system flip flops. This paper presents a novel SEU-tolerant latch where redundant feedback lines are used to mask the effects of SEUs. The power dissipation, area, reliability, and(More)
In this paper, we present a very fast and accurate technique to estimate the soft error rate of digital circuits in the presence of Multiple Event Transients (METs). In the proposed technique, called Multiple Event Probability Propagation (MEPP), a four-value logic and probability set are used to accurately propagate the effects of multiple erroneous values(More)
In this paper, we propose a very fast and accurate analytical approach to estimate the overall SER and to identify the most vulnerable gates, flip-flops, and paths of a circuit. Using such information, designers can selectively protect the vulnerable parts resulting in lower power and area overheads that are the most important factors in embedded systems.(More)
— In this paper, we present a scan-chain-based multiple error recovery technique for triple modular redundancy (TMR) systems (SMERTMR). The proposed technique reuses scan-chain flip-flops fabricated for testability purposes to detect and correct faulty modules in the presence of single or multiple transient faults. In the proposed technique, the manifested(More)