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Mismatch analysis and direct yield optimization by spec-wise linearization and feasibility-guided search
We present a new method for mismatch analysis and automatic yield optimization of analog integrated circuits with respect to global, local and operational tolerances. Effectiveness and efficiency ofExpand
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DATE 2006 Special Session: DFM/DFY Design for Manufacturability and Yield - influence of process variations in digital, analog and mixed-signal circuit design
The concepts of design for manufacturability and design for yield DFM/DFY are bringing together domains that co-existed mostly separated until now $circuit design, physical design and manufacturingExpand
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Mismatch analysis and direct yield optimization by specwise linearization and feasibility-guided search
We present a new method for mismatch analysis and automatic yield optimization of analog integrated circuits with respect to global, local and operational tolerances. Effectiveness and efficiency ofExpand
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WiCkeD: analog circuit synthesis incorporating mismatch
This paper presents a method to consider local process variations, which crucially influence the mismatch-sensitive analog components, within a new simulation-based analog synthesis tool calledExpand
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Analog circuit sizing using adaptive worst-case parameter sets
In this paper a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These sets are calculatedExpand
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Initial sizing of analog integrated circuits by centering within topology-given implicit specifications
We present a novel technique to automatically calculate an initial sizing of analog circuits that conforms to good design practice. The method is purely (DC) simulation-based and does not needExpand
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Systematic analysis & optimization of analog/mixed-signal circuits balancing accuracy and design time
In this paper we will demonstrate the benefits of systematic circuit analysis and optimization applied at different abstraction levels of a typical analog and mixed-signal design to address marketExpand
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A fast method for identifying matching-relevant transistor pairs
This paper presents a new method to identify mismatch-relevant transistor pairs at the circuit level. It consists in a two-stage selection process that is derived from a sensitivity-based formulationExpand
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Initial Sizing of Analog Integrated Circuits by Centering Within Topology-Given Implicit Specification
We present a novel technique to automatically calculate an initialsizing of analog circuits that conforms to good design practice.The method is purely (DC) simulation-based and does not needsymbolicExpand
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Robust Analog Design for Automotive Applications by Design Centering
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or voltage stress, causesExpand
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