• Publications
  • Influence
Environment and Process Adaptive Low Power Wireless Baseband Signal Processing Using Dual Real-Time Feedback
As technology scales below the 45nm CMOS technology node, RF front ends and baseband processors will need to be aggressively overdesigned to work reliably under worst case channel (environment)Expand
  • 6
  • 2
Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing
In this research we study how power can be saved in the baseband processor of an OFDM transceiver from the knowledge of an end application to which the transmitted or received data is applied. TheExpand
  • 3
  • 1
Guided Probabilistic Checksums for Error Control in Low-Power Digital Filters
In many DSP applications (image and voice processing), several dBs of SNR loss can be tolerated without noticeable impact on application level performance. For power optimization in suchExpand
  • 17
Test Enabled Process Tuning for Adaptive Baseband OFDM Processor
As channel conditions in wireless communications improve, the noise performance of the baseband DSP processor can be degraded to save power without compromising bit error rate. The degradation ofExpand
  • 9
Probabilistic Concurrent Error Compensation in Nonlinear Digital Filters Using Linearized Checksums
Soft errors due to alpha particles, neutrons and environmental noise are of serious concern in highly scaled CMOS circuits. This mandates the use of error/noise tolerance mechanisms in circuitExpand
  • 6
Adaptive Signal Scaling Driven Critical Path Modulation for Low Power Baseband OFDM Processors
Modern wireless communication systems are designed for worst-case channel noise and interference conditions. This results in circuits that over-perform and consume more power than necessary most ofExpand
  • 7
Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels
Voltage overscaling for power reduction in RF systems has been limited by the need to maintain sufficient overscaling guard bands to ensure that minimum signal quality requirements of the end to endExpand
  • 4
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations
As technology scales to 40nm and beyond, intra-die process variability causes large delay and leakage variations across a chip in addition to expected die-to-die variations. In this paper, a newExpand
  • 9
Environment and Process Adaptive Low Power Wireless Baseband Signal Processing Using Dual Real-Time Feedback
As technology scales below the 45nm CMOS technology node, RF front ends and baseband processors will need to be aggressively overdesigned to work reliably under worst case channel (environment)Expand
  • 2
Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on systemExpand
  • 2