M. K. McPhun
Highly Influential Citations1
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A new method of calibration that uses three short-circuits (one direct and two offset short-circuits) enables the scattering parameters of the error network to be evaluated, and makes corrected… Continue Reading
Two new methods of measurement correction using network analysers are introduced. These methods not require the use of elaborate calibration standards and may be used for measurement at other than… Continue Reading
The paper is mainly devoted to a detailed account of the design of the reflection amplifiers for use in a tunnel-diode repeater described in a companion paper. The amplifiers are constructed in… Continue Reading
A method of obtaining the correct emitter junction capacitance Cb'e from the measured device parameters is presented. This method is shown to apply to integrated bipolar transistors having fT ≃ 2.5… Continue Reading
The panel members were asked to respond to the Editor's question, given below. They were then given copies of each others comments, and asked to respond with a second-round of opinions.
Practical results relating to the accuracy of 100 sets of repeated reflection-coefficient measurements using a computer-corrected network analyser are given. Statistical data based on the above sets… Continue Reading
After transistors had been used for industrial instrumentation within the Development and Engineering Group of the United Kingdom Atomic Energy Authority for some years, silicon transistors were… Continue Reading
The letter describes a technique for calibration of an H011 cavity for surface-resistance measurements of thin-film and bulk samples at 10 GHz. After calibration and insertion of the sample, it is… Continue Reading
The first part of the paper considers the properties and design requirements of short-hop radio-relay systems; in particular, systems using nondemodulating, nonfrequency-changing repeaters. It is… Continue Reading