M. Millecam

Learn More
0026-2714/$ see front matter 2008 Elsevier Ltd. A doi:10.1016/j.microrel.2008.06.043 * Corresponding author. Tel.: +32 55 332343. E-mail address: jan.ackaert@onsemi.com (J. Ackae Metal–insulator–metal capacitor (MIMC) reliability and electrical properties are defined by the TDDB lifetime, breakdown voltage and leakage current. In this article, the(More)
  • 1