M.J. Crossley

  • Citations Per Year
Learn More
A focused ion beam (FIB) is used to process 2-D self-assembled photonic porphyrin film flats to fabricate couplers in 2-D porphyrin slabs. These self-assembled structures have an initial root mean squared (rms) values for surface roughness ≪ 0.5 nm as measured by atomic force microscopy. Under appropriate FIB processing and cutting conditions, the(More)
  • 1