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  • M. Kole
  • 2007
An iterative simulation environment for reliability problems due to long-term circuit degradation has been developed for use in SPICE-like simulators. A model developed for the NBTI (negative bias temperature instability) degradation effect in the standard Verilog-A language can be used with this reliability simulator. Integration in a design environment(More)
This paper presents an analog circuit design assistance tool called Adapt. The tool can perform automatic circuit sizing over a wide range of heterogeneous design parameters. We present Adapt's architecture and the design flow, discuss important user-interface aspects of the tool, disclose details on the optimization algorithms incorporated in the tool, and(More)
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