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We consider the diffraction of a given axially–symmetric electromagnetic wave by two zero-thickness stacked PEC disks. We derive a set of dual coupled integral equations in terms of scalar Hankel transforms that enable us to perform analytical regularization with the aid of the static part inversion.
Photoluminescence microscopy of as-grown individual single-walled carbon nanotubes on Si/SiO 2 substrates, phys. separation studies of single walled carbon nanotube dispersions, phys. stat. sol. The mechanism of cavitation-induced scission of single-walled carbon nanotubes, Photoluminescence microscopy of carbon nanotubes grown by chemical vapor deposition:… (More)