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OBJECTIVES X-linked adrenoleukodystrophy is a genetically determined disorder that causes varying degrees of malfunction of the adrenal cortex and central nervous system. Our aim was to investigate the occurrence of known, or new, mutations in the ABCD1 gene in two unrelated patients with clinical suspicion of the adrenoleukodystrophy. METHODS Two… (More)
This paper deals with the automatic test pattern generation (ATPG) technique at the higher level using a functional fault model and defect-fault relationship in the form of a defect coverage table at the lower level. The paper contributes to test pattern generation (TPG) techniques taking into account physical defect localisation. A new… (More)
The paper presents a software tool that demonstrates principles of RAM memory testing and of the memory BIST structure. The MemBIST software tool automatically generates built-in self-test blocks for a given memory matrix as a VHDL model of the whole system. As a complement to the BIST structure generator, a module for visualisation of selected RAM memory… (More)
Built-in self-repair (BISR) architectures and methods are widely used for memory cores of system-on-chips (SoCs), where the area-efficient fault detection and repair are crucial in order to meet the high quality requirements. Research of BISR architectures for logic cores has begun as well. However, the irregular structure of logic cores represents a… (More)
The paper presents implementation of a test pattern generation technique that uses cellular automaton construction based on the analysis of a pre-computed test set. The algorithm is included into the Java applet for automatic synthesis of the built-in self-test structure into a digital circuit modeled in VHDL.
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