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— Negative bias temperature instability (NBTI), which causes temporal performance degradation in digital circuits by affecting PMOS threshold voltage, has become the dominant circuit lifetime reliability factor. Design for lifetime reliability, especially for NBTI-induced circuit performance degradation, is emerging as one of the major design concerns. In(More)
To investigate the vesicle shapes of the area difference elasticity (ADE) model, the shooting method and mathematica software were used to calculate the shapes of vesicles. Results not only several corresponding shapes of vesicles, such as oblate and prolate shapes were obtained but also some new shapes of vesicles were gained by limiting some parameters in(More)
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