Luo Dacheng

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An x-ray interferometer (XRI), which takes the lattice spacing of silicon as a length unit, can measure displacement with subnanometer resolution. A scanning probe microscope that combines an XRI and a scanning-tunnel microscope is designed to measure pitch. Experimental results have proved the feasibility of the design.
In order to construct the INS/GPS deep integrated navigation system with different accuracy requirements, the influence of inertial navigation system on the accuracy of inertial navigation system is studied. In an INS/GPS deep integrated navigation system, the extent of the reduction of the Doppler frequency search range of satellite receiver, the improving(More)
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