Luis Botaya

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Quartz tuning forks have become popular in nanotechnology applications, especially as sensors for scanning probe microscopy. The sensor's spring constant and the oscillation amplitude are required parameters to evaluate the tip-sample forces; however, there is certain controversy within the research community as to how to arrive at a value for the static(More)
Quartz Tuning Fork (QTF)-based Scanning Probe Microscopy (SPM) is an important field of research. A suitable model for the QTF is important to obtain quantitative measurements with these devices. Analytical models have the limitation of being based on the double cantilever configuration. In this paper, we present an electromechanical finite element model of(More)
Here we devise a multiprobe electrical measurement system based on quartz tuning forks (QTFs) and metallic tips capable of having full 3D control over the position of the probes. The system is based on the use of bent tungsten tips that are placed in mechanical contact (glue-free solution) with a QTF sensor. Shear forces acting in the probe are measured to(More)
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