Loïc Zussa

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—The use of electromagnetic glitches has recently emerged as an effective fault injection technique for the purpose of conducting physical attacks against integrated circuits. First research works have shown that electromagnetic faults are induced by timing constraint violations and that they are also located in the vicinity of the injection probe. This(More)
Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. HAL is a multidisciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not. The documents may come from teaching and research institutions in France or abroad,(More)
In this paper we study the information leakage that may exist, due to electrical coupling, between logically independent blocks of a secure circuit as a new attack path to retrieve secret information. First, an aes-128 has been implemented on a fpga board. Then, this aes implementation has been secured with a delay-based countermeasure against fault(More)
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