Learn More
Reduction in leakage power has become an important concern in low voltage, low power and high performance applications. In this paper, we use dual threshold technique to reduce leakage power by assigning high threshold voltage to some transistors in non-critical paths, and using low-threshold transistors in critical paths. In order to achieve the best(More)
The nonhuman primates most commonly used in medical research are from the genus Macaca. To better understand the genetic differences between these animal models, we present high-quality draft genome sequences from two macaque species, the cynomolgus/crab-eating macaque and the Chinese rhesus macaque. Comparison with the previously sequenced Indian rhesus(More)
Low supply voltage requires the device threshold to be reduced in order to maintain performance. Due to the exponential relationship between leakage current and threshold voltage in the weak inversion region, leakage power can no longer be ignored. In this paper we present a technique to accurately estimate leakage power by accurately modeling the leakage(More)
Dual threshold technique has been proposed to reduce leakage power in low voltage and low power circuits by applying a high threshold voltage to some transistors in non-critical paths, while a low-threshold is used in critical path(s) to maintain the performance. Mixed-Vth (MVT) static CMOS design technique allows di erent thresholds within a logic gate,(More)
We describe various design automation solutions for design migration to a dual-Vt process technology. We include the results of a Lagrangian Relaxation based tool, iSTATS, and a heuristic iterative optimization flow. Joint dual-Vt allocation and sizing reduces total power by 10+% compared with Vt allocation alone, and by 25+% compared with pure sizing(More)
| Low supply voltage requires the device threshold to be reduced in order to maintain performance. Due to the exponential relationship between leakage current and threshold voltage in the weak inversion region, leakage power can be no longer negligible in such circuits. In this paper we present a technique to accurately estimate leakage power by accurately(More)