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We propose a false-path-aware statistical timing analysis framework. In our framework, cell as well as interconnect delays are assumed to be correlated random variables. Our tool can characterize statistical circuit delay distribution for the entire circuit and produce a set of true critical paths.
The use of functional vectors has been an industry standard for speed binning purposes of high performance ICs. This practice can be prohibitively expensive as the ICs become faster and more complex. In comparison, structural patterns can target performance related faults in a more systematic manner. To make structural testing an effective alternative to(More)
Critical path selection is an indispensable step for testing of small-size delay defects. Historically, this step relies on the construction of a set of worst-case paths, where the timing lengths of the paths are calculated based upon discrete-valued timing models. The assumption of discrete-valued timing models may become invalid for modeling delay effects(More)
This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect diagnosis and traditional logic defect diagnosis. We propose different diagnosis algorithms, and evaluate their performance via statistical defect injection and statistical delay fault(More)
The developments of efficient SAT solvers have attracted tremendous research interest in recent years. The merits of these solvers are often compared in terms of their performance based upon a wide spread of benchmarks. In this paper, we extend an earlier-proposed solver design concept called (SCGL) Signal Correlation Guided Learning that is ATPG-based into(More)
In the post-silicon stage, timing information can be extracted from two sources: (1) on-chip monitors and (2) delay testing. In the past, delay test data has been overlooked in the correlation study. In this paper, we take path delay testing as an example to illustrate how test data can be incorporated in the overall design-silicon correlation effort. We(More)
We present a novel hybrid finite-domain constraint solving engine for RTL circuits, that automatically uses data-path abstraction. We describe how DPLL search can be modified by using efficient finite-domain constraint propagation to improve communication between interacting integer and Boolean domains. This enables efficient combination of Boolean SAT and(More)
A latch-based timing analyzer is an essential tool for developing high-speed pipeline designs. As process variations increasingly influence the timing characteristics of DSM designs, a timing analyzer capable of handling process-induced timing variations for latch-based pipeline designs becomes in demand. In this work, we present a static statistical timing(More)
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional logic defect diagnosis. The key difference between our validation framework and other traditional diagnosis methods lies in our assumptions of the statistical circuit timing and(More)
This paper studies the problem of automatic assertion extraction at the input boundary of a given unit embedded in a system. This paper proposes a data mining approach that analyzes simulation traces to extract the assertions. We borrow two key concepts from the sequential data mining and develop an effective assertion extraction approach specific to our(More)