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We propose a false-path-aware statistical timing analysis framework. In our framework, cell as well as interconnect delays are assumed to be correlated random variables. Our tool can characterize statistical circuit delay distribution for the entire circuit and produce a set of true critical paths.
This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensitizable path. In the ATPG process, we utilize an efficient false-path pruning technique to identify the longest sensitizable path through each fault site. We demonstrate that our new(More)
The use of functional vectors has been an industry standard for speed binning purposes of high performance ICs. This practice can be prohibitively expensive as the ICs become faster and more complex. In comparison, structural patterns can target performance related faults in a more systematic manner. To make structural testing an effective alternative to(More)
The developments of efficient SAT solvers have attracted tremendous research interest in recent years. The merits of these solvers are often compared in terms of their performance based upon a wide spread of benchmarks. In this paper, we extend an earlier-proposed solver design concept called (SCGL) Signal Correlation Guided Learning that is ATPG-based into(More)
A latch-based timing analyzer is an essential tool for developing high-speed pipeline designs. As process variations increasingly influence the timing characteristics of DSM designs, a timing analyzer capable of handling process-induced timing variations for latch-based pipeline designs becomes in demand. In this work, we present a static statistical timing(More)
In VLSI module placement, it is very practical to consider placing some modules along the pre-specified boundaries of the chip so that the modules are easier to be connected to certain I/O pads. In this paper, we study the module placement problem where some modules have the boundary constraints, and present a simulated annealing based algorithm that(More)
This paper studies the problem of automatic assertion extraction at the input boundary of a given unit embedded in a system. This paper proposes a data mining approach that analyzes simulation traces to extract the assertions. We borrow two key concepts from the sequential data mining and develop an effective assertion extraction approach specific to our(More)
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating the test quality with respect to timing defects under process variations. Based on the proposed metric and a dynamic timing analyzer, we develop a pattern-selection algorithm for(More)