Lew Rabenberg

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An analysis of the effects of lens aberrations on the phase contrast images used for strain measurement by geometric phase analysis (GPA) in the TEM shows that errors may result when strain gradients are present and when [formula: see text] at the reciprocal lattice spacing used for the analysis. This conclusion is demonstrated experimentally using a model(More)
We demonstrate a top-down method for fabricating nickel mono-silicide (NiSi) nanolines (also referred to as nanowires) with smooth sidewalls and line widths down to 15 nm. Four-probe electrical measurements reveal that the room temperature electrical resistivity of the NiSi nanolines remains constant as the line widths are reduced to 23 nm. The resistivity(More)
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