—This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the – curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate effects and HBM/TLP correlation and miscorrelation.… (More)
– In this work, we demonstrate that both capacitance and inductance must be the central parameters associated with the Charged Device Model (CDM) waveform verification modules. We also propose a change from the previously used FR-4 dielectric material substrate to a more stable Alumina. This improves waveform repeatability and will lead to better… (More)
The IC industry continues to find ways to improve the ability to correlate the electrical failure signature of devices with the physical failure location using different techniques. The purpose of this work is to show that improved transmission line pulse (TLP) testing technique of ESD (ElectroStatic Discharge) protection structures can provide accurate… (More)
– Parameters associated with an observed variation in CDM ESD waveforms are shown to be pogo pin diameter, pogo pin length, ground plane size, and distance between ground plane and charge plate. The effects on resulting discharge waveforms and solutions for improvement of existing CDM standards will be discussed.
A new technique for accurately tracking leakage currents has emerged. The integrated circuit (IC) industry has been using transmission-line pulse (TLP) testing to characterize on-chip electrostatic discharge (ESD) protection structures since 1985. This TLP ESD testing technique was introduced by Maloney and Khurana as a new electrical analysis tool to test… (More)