L. Rolindez

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The test of Analogue and Mixed-Signal (AMS) cores requires the use of expensive AMS testers and accessibility to internal analogue nodes. The test cost can be considerably reduced by the use of Built-In-Self-Test (BIST) techniques. One of these techniques consists in generating analogue test signals from digital test patterns (obtained via [Sigma-Delta](More)
The estimation of test metrics such as defect level, test yield or yield loss is important in order to quantify the quality and cost of a test approach. In the analogue domain, previous works have considered the estimation of these metrics for the case of single faults, either catastrophic or parametric. The consideration of single parametric faults is(More)
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