L M Beltrán-Del-Río

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, quasicrystals, grain boundaries, nanoparticles or arbitrary(More)
  • 1