Kunihiko Iizuka

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—A capacitively coupled probing circuit with a novel de-skewer, a low-pass filter and a high-sensitivity receiver is proposed to realize a membrane-based wafer-level simultaneous testing robustly. The de-skewer can be designed by only digital core transistors and has stable feed-forward architecture. The receiver with the low-pass filter can suppress the(More)
The major problem that has prevented practical application of analog neuro-LSIs has been poor accuracy due to fluctuating analog device characteristics inherent in each device as a result of manufacturing. This paper proposes a dynamic control architecture that allows analog silicon neural networks to compensate for the fluctuating device characteristics(More)