Kuay Chong Lee

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
We combine Electro Optical Terahertz Pulse Reflectometry (EOTPR), with full three dimensional device-under-test (DUT) modeling utilizing virtual known good device to quickly and non-destructively isolate faults in advanced 3D IC packages. Computation power required for modeling can quickly become prohibitive with the design complexities of modern IC(More)
Integrated Circuit (IC) Design has always been a challenge to designers. There are two approaches that can be used to draft architecture of an integrated circuit which are the old approach of using Custom and a new one using ASIC. ASIC has been preferred by IC designers as it manipulates liberty files to provide suggestion on the architecture design faster(More)
  • 1