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While the feature size of micro-fabricated structures is continuously diminishing, the issue of high accuracy measurement becomes increasingly significant. In recent years, Atomic Force Microscopy (AFM) has become a powerful measurement tool which has been widely used in micro- and nano-fabricated structure inspection. However, owing to the fixed tilting(More)
SUMMARY To achieve a high compression ratio when storing a large amount of Chinese characters is a problem in applications using Chinese characters. In this paper, we present a data compression software system which can reduce the storage requirement of Chinese characters and binary images. This system is composed of a Chinese font compressing subsystem and(More)
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