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We provide an analysis of the nature of emfs induced during the operation of a railgun. The focus here is on the railguns, but the results are applicable to a broad range of similar distributed parameter problems. The main sources of induced emfs are current changes and armature motion. New perspectives are presented. It is shown, for example, that there is… (More)
A new technique has been developed for determining the inductance and resistance gradients of electromagnetic launchers. These are fundamental parameters when estimating launcher performance. The method is based on our analysis that shows how a transmission line model describes the relationship between the voltage gradient along the launcher rails and the… (More)
An Object Oriented Particle-in-Cell model of a plasma glow discharge in a cylindrical magnetron cleaning device has been developed to provide guidance in developing a novel in situ surface conditioning technique. The model tracks the trajectories of particles by solving the equations of motion and the electrostatic field equations. Simulation results are… (More)
An algorithm for determining the optical constants of thin films from normal incidence reflection and transmission measurements is presented. To facilitate the solution of the equations described in this problem, properties of the plot of the function k(1) (n(1)) are utilized. The algorithm obtained is more effective than the one proposed by Tomlin.
The electromagnetic launcher is currently being explored as an alternative to propellant gun systems to satisfy the ordnance requirements of future military systems. Recent improvements in component technologies have increased the plausibility of making the electromagnetic launcher a practical alternative to chemically driven guns. The U.S. Army Armament… (More)
The results of investigations into the production methods of Gd(2)O(3), Eu(2)O(3), Er(2)O(3), Yb(2)O(3) films are presented. A description of the optical properties contains the optical constants n and k of the films evaporated by an electron-beam gun in the 0.2-9-microm wavelength range. Interpretations of the IR absorption bands is given.
A new electron microscopy technique to study topography on thin films is reported. The technique is based on the use of weak diffracted beams. Applications to the characterization of single and polycrystalline films is discussed.