Kristian M. Hafkemeyer

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
This paper is about setting up of an opamp array test structure for investigating the degradation of differential amplifier circuit performance and variation of its individual transistor parameters in a stress test. In an analog circuit implemented using transistors with ultra-thin gate dielectric oxide, the increased gate leakage current results in the(More)
  • 1