Konstantine Kaznatcheev

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2J H Burge
2T Bothe
2P Su
1M Schulte
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Coherent X-ray scattering is an emerging technique for measuring structure at the nanoscale. Data management and analysis is becoming a bottleneck in this technique. We present an unsupervised method which can sort and cluster the scattering snapshots, uncovering patterns inherent in the data. Our algorithm operates without resorting to templates, specific(More)
In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure(More)
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