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- Publications
- Influence
Simulation assisted uncovering and understanding of complex failures in 28nm microprocessor devices
- Dnyan Khatri, V. Narang, Mun Yee Ho, Komal Pandey, R. Yu
- Engineering
- IEEE 23rd International Symposium on the Physical…
- 18 July 2016
With rapid developments in semiconductor manufacturing technologies, new and more complicated challenges emerge in the Failure Analysis space. The real challenge arises when similar electrical data… Expand
Review of Bandgap Voltage Reference for Analog and Mixed Signal Circuit
---------------------------------------------------------------------***--------------------------------------------------------------------Abstract This paper presents a review of the design of… Expand
Sensing Harmful Gases in Industries Using IOT and WSN
- S. Golait, R. Kumar, Twinkle Pandey, Samiksha Yerpude, Komal Pandey, Ajinkya Ghadole
- Computer Science
- 11 February 2020