Klaus Oberländer

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h MUCH HAS BEEN published on the development and properties of memory test algorithms [1]–[9]. The theory of functional fault models (FFMs), performance, and effectiveness of test algorithms are commonly confirmed by simulation. In this paper, we present a study on the effectiveness of memory test algorithms based on test results gathered during production(More)
Issues related to on-line testing are increasingly important in modern electronic systems. The huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques to increase the system(More)
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