Kiran George

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A new approach to optimize a configurable two-dimensional (2-D) linear feedback shift registers (LFSR) for both embedded and random test pattern generation in built-in self-test (BIST) is proposed. This configurable 2-D LFSR based test pattern generator generates: 1) a deterministic sequence of test patterns for random-pattern-resistant faults, and then 2)(More)
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