Kiran B. Doreswamy

Learn More
We propose a new technique for static compaction of test sequences. Our method is based on two key ideas: (1) overlapped vector restoration, and (2) identification, pruning, and re-ordering of segments. Overlapped restoration provides a significant computational advantage for large circuits. Segments partition the compaction problem into sub-problems.(More)
This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first performed, as a preprocessing step, to identify nets which are uncontrollable to a specific logic value. Then, an implication-based analysis is carried out for each fault to(More)
  • 1