Kenji Higashida

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Electron tomography requires a wide angular range of specimen-tilt for a reliable three-dimensional (3D) reconstruction. Although specimen holders are commercially available for tomography, they have several limitations, including tilting capability in only one or two axes at most, e.g. tilt-rotate. For amorphous specimens, the image contrast depends on(More)
A novel specimen holder that enables in situ observation of crack-tip deformation and/or fracture under a controlled environment is developed for a high-voltage electron microscope (HVEM). A window-type environmental cell (EC) that incorporates a uniaxial straining apparatus is built into a side-entry-type single-tilt specimen holder. The gas control in EC,(More)
We succeeded the observation of microstructures in bulk-sized specimens of over 10µm in thickness by employing a technique that combines transmission electron microscopy (TEM) with energy-filtered imaging based on electron energy-loss spectroscopy (EELS). This method is unique in that it incorporates the inelastically scattered electrons into the imaging(More)
Crack tip dislocations in silicon crystals have been studied using high voltage electron microscopy (HVEM). The dislocation images have been investigated by comparing the observed images to those that were simulated. Dislocation images were computed in the conditions g x b = 0, 1 or 2 (g: diffraction vector, b: Burgers vector). The characteristics of 60(More)
Three-dimensional structures of crack-tip dislocations in silicon crystals have been examined by combining scanning transmission electron microscopy and computed tomography. Cracks were introduced by a Vickers hardness tester at room temperature, and the sample was heated at 823 K for 1 h in order to introduce dislocations around the crack tips. Dislocation(More)
Crack-tip dislocations in silicon crystals have been examined by using high-voltage electron microscopy. Cracks were introduced by the Vickers indentation method at room temperature and the indented specimens were annealed at high temperatures to induce dislocations around crack tips under the presence of residual stress due to the indentation. A selected(More)
The microstructures of ¡-Mg, long-period stacking ordered (LPSO) phases, and kink bands in a Mg­Y­Zn alloy were observed by transmission electron microscopy (TEM). The results showed that extruded Mg97Zn1Y2 alloy included different kinds of phases: 2H-Mg, 2H-Mg with many stacking faults, 14H and 18R. Kink bands tended to occur in areas where there were many(More)
Measurement of 99mTc-MAG3 plasma clearance based on 1-compartment model (MPC method) were applied to 12 pediatric patients and evaluated for the factors which might affect the calculated results. Depth correction is a critical factor for the measurement of renal uptake. Three different equations for estimating renal depth were compared with the real depth(More)
Dislocation structures developed in hinge-type plastic zones associated with cracks in silicon crystals have been studied using a high voltage electron microscope (HVEM). Fine slip bands due to those dislocations have been also examined by an atomic force microscope (AFM). {100} and {110} cracks were introduced into {110} silicon wafers at room temperature(More)
Deformation microstructure and texture in a cold-rolled austenitic steel 310S with low stacking fault energy (SFE) have been investigated by SEM and TEM. When 310S plates were rolled by 95% in thickness reduction, a remarkable development of the brass-type preferred orientation was confirmed by X-ray diffraction. SEM observations of the specimens with such(More)