Keith A. Bowman

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A model describing the maximum clock frequency (FMAX) distribution of a microprocessor is derived and compared with wafer sort data for a recent 0.25m microprocessor. The model agrees closely with measured data in mean, variance, and shape. Results demonstrate that within-die fluctuations primarily impact the FMAX mean and die-to-die fluctuations determine(More)
A 65 nm resilient circuit test-chip is implemented with timing-error detection and recovery circuits to eliminate the clock frequency guardband from dynamic supply voltage and temperature variations as well as to exploit path-activation probabilities for maximizing throughput. Two error-detection sequential (EDS) circuits are introduced to preserve the(More)
A 45 nm microprocessor core integrates resilient error-detection and recovery circuits to mitigate the clock frequency guardbands for dynamic parameter variations to improve throughput and energy efficiency. The core supports two distinct error-detection designs, allowing a direct comparison of the relative trade-offs. The first design embeds(More)
Three circuit techniques for dynamic variation tolerance are presented: (i) Sensors with adaptive voltage and frequency circuits, (ii) Tunable replica circuits for timing-error prediction with error recovery, and (iii) Embedded error-detection sequential circuits with error recovery. These circuits mitigate the clock frequency guardbands for dynamic(More)
A statistical performance simulator is developed to explore the impact of die-to-die (D2D) and within-die (WID) parameter variations on the distributions of maximum clock frequency (FMAX) and throughput for multi-core processors in a future 22nm technology.allThe simulator integrates a compact analytical throughput model, which captures the key dependencies(More)
A new compact physics-based Alpha-Power Law MOSFET Model is introduced to enable projections of low power circuit performance for future generations of technology by linking the simple mathematical expressions of the original Alpha-Power Law Model with their physical origins. The new model, verified by HSPICE simulations and measured data, includes: 1) a(More)
Die-to-die and within-die variations impact the frequency and power of fabricated dies, affecting functionality, performance, and revenue. Variation-tolerant circuits and post-silicon tuning techniques are important for minimizing the impacts of these variations. This paper describes several circuit techniques that can be employed to ensure efficient(More)