Keiji Nakabayashi

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We present a new technique for the electro-thermal modeling and reliability simulation of power MOSFETs with SystemC-AMS. We model the non-linear electrical characteristics and self-heating effect of the power MOSFETs, and improve a numerical integration method in order to solve numerical instability of SystemC-AMS. Our technique is verified by experimental(More)
We propose a new equation-based modeling technique for electro-thermal and reliability circuit analysis of power MOSFET circuits with Mathematica. We express the electrical characteristics and self-heating effect of a power MOSFET as a system of ordinary differential equations, and use a numerical solver of Mathemtica to obtain a solution of the system. We(More)
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