Keheng Huang

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— As the feature size shrinks to the nanometer scale, SRAM-based FPGAs will become increasingly vulnerable to soft errors. Existing reliability-oriented placement and routing approaches primarily focus on reducing the fault occurrence probability (node error rate) of soft errors. However, our analysis shows that, besides the fault occurrence probability,(More)
As the feature size and threshold voltage reduce, leakage power dissipation becomes an important concern in SRAM-based FPGAs. This work focuses on reducing the leakage power in routing resources, and more specifically, the leakage power dissipated in the used part of FPGA device, which is known as the active leakage power. We observe that the leakage power(More)
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