Katsuichi Kitagawa

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A new surface profiling algorithm called the local model fitting (LMF) method is proposed. LMF is a single-shot method that employs only a single image, so it is fast and robust against vibration. LMF does not require a conventional assumption of smoothness of the target surface in a band-limit sense, but we instead assume that the target surface is locally(More)
The local model fitting (LMF) method is a useful single-shot surface profiling algorithm that features fast measurement speed and robustness against vibration. However, the measurement range of the LMF method (i.e., measurable height difference between two neighboring pixels) is limited up to a quarter of the light source wavelength. To cope with this(More)
The local model fitting (LMF) method is one of the useful single-shot surface profiling algorithms. The measurement principle of the LMF method relies on the assumption that the target surface is locally flat. Based on this assumption, the height of the surface at each pixel is estimated from pixel values in its vicinity. Therefore, we can estimate flat(More)
The local model fitting (LMF) method is a useful single-shot surface profiling algorithm based on spatial carrier frequency fringe patterns. The measurement principle of the LMF method relies on the assumption that the target surface is locally flat. In this paper, we first analyze the measurement error of the LMF method caused by violation of the locally(More)
Wind damage in Japan is mainly caused by typhoons (i.e., tropical cyclones), which are characterized by intensive heavy rainfall and strong winds. In this study, we conducted tree-pulling experiments on two sites to find out whether rapidly supplied water on the soil would affect stability of root anchorage of hinoki (Chamaecyparis obtuse (Sieb. Et Zucc.)(More)
Conventional transparent film thickness measurement methods such as spectroscopy are essentially capable of measuring only a single point at a time, and their spatial resolution is limited. We propose a film thickness measurement method that is an extension of the global model-fitting algorithm developed for three-wavelength interferometric surface(More)
We have developed a novel areal film thickness and topography measurement method using three-wavelength interferometry. The method simultaneously estimates the profiles of the front and back surfaces and the thickness distribution of a transparent film by model-based separation of two overlapped signals in an interferogram. The validity of the proposed(More)
We propose a fast surface-profiling algorithm based on white-light interferometry by use of sampling theory. We first provide a generalized sampling theorem that reconstructs the squared-envelope function of the white-light interferogram from sampled values of the interferogram and then propose the new algorithm based on the theorem. The algorithm extends(More)
The local model fitting (LMF) method is a single-shot interferometric surface profiling algorithm that possesses nondestructive, fast, accurate, and robust measurement capabilities. To extend the measurement range of LMF, extensions based on multiwavelength light sources such as the multiwavelength-matched LMF (MM-LMF) method and the(More)