Kartheek Chandu

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—Programmable Graphics Processing Unit (GPU) has emerged as a powerful parallel processing architecture for various applications requiring a large amount of CPU cycles. In this paper, we study the feasibility for using this architecture for image halftoning, in particular implementing computationally intensive neighborhood halftoning algorithms such as(More)
—We illustrate how employing Graphics Processing Units (GPU) can speed-up intensive image processing operations. In particular, we demonstrate the use of the NVIDIA CUDA architecture to implement a color digital binary halftoning algorithm based on Direct Binary Search (DBS). Halftoning a color image is more computationally expensive than the single color(More)
Multi-bit screening is an extension of binary screening, in which every pixel in continuous-tone image can be rendered to one among multiple absorptance levels. Many multi-bit screen algorithms face the problem of contouring artifacts due to sudden changes in the majority absorptance level between gray levels. In this paper, we have extended the direct(More)
We describe a method for automatically detecting streaks in printed images using adaptive window-based image projections and mutual information. The proposed approach accepts a scanned image enclosing the defect and computes the projections across the entire image at different window sizes. The resulting traces collected from the projections are analyzed(More)
We describe a method for automatically classifying image-quality defects on printed documents. The proposed approach accepts a scanned image where the defect has been localized a priori and performs several appropriate image processing steps to reveal the region of interest. A mask is then created from the exposed region to identify bright outliers.(More)
In this paper, we propose a defect analysis system, which automatically aligns a digitized copy of a printed output to a reference electronic original and subsequently illustrates potential image quality artifacts. We focus on image defects or artifacts caused by shortfalls in mechanical or electro-photographic processes. In this method, log-polar transform(More)
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