Karl B. Schliep

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Real-space imaging of full-morphological, angstrom-scale structural dynamics occurring on the femtosecond (fs) timescale is possible with ultrafast electron microscopy (UEM) via the stroboscopic pump-probe methodology enabled by interfacing an otherwise standard TEM with a short-pulsed laser system [1-3]. The technology has matured to the point that(More)
Ultrafast electron microscopes with thermionic guns and LaB6 sources can be operated in both the nanosecond, single-shot and femtosecond, single-electron modes. This has been demonstrated with conventional Wehnelt electrodes and absent any applied bias. Here, by conducting simulations using the General Particle Tracer code, we define the electron-gun(More)
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