Kan-Sheng Shi

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Process of configuration and fault scan is required to be repeated many times before all resources of a FPGA-under-test are tested and diagnosed. Both FPGA test system and test schemes have been studied and presented in the keynote. Construction of the in-house developed FPGA test system is based on SOC HW/SW co-verification technology. Algorithms for FPGA(More)
In mulddatabase management systems, schema integration or view generation is a process that derives a global view from the local schemas of component database systems. In order to achieve an integrated object-oriented view, the needs of a framework for classifying global equivalences and operations for extracting overlapping information based on the(More)
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