19th International Conference on VLSI Design heldâ€¦

2006

The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N times the minimal test set size for N = 1. Testsâ€¦ (More)

20th International Conference on VLSI Design heldâ€¦

2007

We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimization. This is a polynomial-time solution that closely approximates the exact but NP-hardâ€¦ (More)

Except where reference is made to the work of others, the work described in this thesis is my own or was done in collaboration with my advisory committee. This thesis does not include proprietary orâ€¦ (More)

Testability measures* play an important role in VLSI testing. The circuit complexity is increasing every day and so is the demand for efficient testability measures. So a brief overview of theâ€¦ (More)