Learn More
We evaluate the performance of a novel fast characterization methodology for NBTI and PBTI measurements. We show that the use of a programmable PCI card in combination with linear current amplifiers(More)
We demonstrate the smallest FinFET SRAM cell size of 0.063 &#x00B5;m<sup>2</sup> reported to date using optical lithography. The cell is fabricated with contacted gate pitch (CPP) scaled to 80 nm and(More)
Strained-silicon-on-insulator (SSOI) undoped-body high-&#x03BA; /metal-gate n-channel fin-shaped field-effect transistors (nFinFETs) at scaled gate lengths and pitches (i.e.,<i>L</i><sub>GATE</sub> ~(More)