K. Paramasivam

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C. G. Rusin1
H. D. Spapen1
S. Kluge1
F. H. Bosch1
1C. G. Rusin
1H. D. Spapen
1S. Kluge
1F. H. Bosch
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— Power consumption has become a crucial concern in Built In Self Test (BIST) due to the switching activity in the circuit under test(CUT). In this paper we present a novel method which aims at minimizing the total power consumption during testing. This is achieved by minimizing the switching activity in the circuit by reducing the Hamming Distance between(More)
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