K. Chanda

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The NMOSFET-only pass gates used in some digital CMOS applications, such as the Field-Programmable Gate Arrays (FPGAs), are apparently vulnerable to Positive Bias Temperature Instability (PBTI). Here we discuss the impact of PBTI frequency and workload on high-k/metal-gate NMOSFETs in terms of Capture-and-Emission Time (CET) maps and quantitatively explain(More)
This study borrows the measures developed for the operation of water resources systems as a means of characterizing droughts in a given region. It is argued that the common approach of assessing drought using a univariate measure (severity or reliability) is inadequate as decision makers need assessment of the other facets considered here. It is proposed(More)
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