Junliang Liu

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Oxygen-annealed surfaces of sapphire with low Miller indices ((0001), [1010], [1120], [1011]) have been studied in both transmission electron microscopy (TEM) and reflection electron microscopy (REM) configurations. The significance of REM diffraction conditions for the determination of the nature of the step heights is discussed. The relationship between(More)
Annealed (0001) surfaces of single-crystal sapphire (alpha-Al2O3) rod have been studied in the electron microscope using reflection electron microscopy (REM), scanning reflection electron microscopy (SREM), and reflection high energy electron diffraction (RHEED). Annealed surfaces of (0001) sapphire are vicinal and characterized by close-packed(More)
In the present work, ultra-high-strength steels with multiphase microstructures containing martensite and bainite were prepared by controlling the cooling rate. A new approach was proposed for quantitatively statistical phase analysis using electron backscatter diffraction (EBSD) based on the band contrast which correlates to the quality and intensity of(More)
In order to investigate the structure of Fe–Zn phase in a commercial galvannealed IF steel sheet, the electron diffraction and composition of phase in a commercial galvannealed IF steel sheet were studied by transmission electron microscope (TEM) and X-ray energy dispersive spectroscopy (EDX). The cross-sectional TEM specimen was prepared using focused ion(More)
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